Y Sfikas
Name | Y Sfikas |
---|---|
First Name | Yiorgos |
gsfikas@cs.uoi.gr | |
Author Type | External |
Affiliation | University of Ioannina, Ioannia 45110, Greece |
Publications
Y Sfikas, Y Tsiatouhas, M. Taouil, S. Hamdioui,
On Resistive Open Defect Detection in DRAMs: The Charge Accumulation Effect
(May 2015),
20th IEEE European Test Symposium (ETS 2015), 25-29 May 2015, Cluj-Napoca, Romania
[Conference Proceedings]
Y Sfikas, Y Tsiatouhas, S. Hamdioui,
Layout-Based Refined NPSF Model for DRAM Characterization and Testing
(June 2014),
IEEE Transactions On Very Large Scale Integration (VLSI) Systems (TVLSI), volume 22
[Journal Paper]