Y Sfikas, Y Tsiatouhas, M. Taouil, S. Hamdioui, On Resistive Open Defect Detection in DRAMs: The Charge Accumulation Effect (May 2015), 20th IEEE European Test Symposium (ETS 2015), 25-29 May 2015, Cluj-Napoca, Romania [Conference Proceedings]

Y Sfikas, Y Tsiatouhas, S. Hamdioui, Layout-Based Refined NPSF Model for DRAM Characterization and Testing (June 2014), IEEE Transactions On Very Large Scale Integration (VLSI) Systems (TVLSI), volume 22 [Journal Paper]