P. Debaud

NameP. Debaud
First NamePhilippe
Author TypeExternal
AffiliationSTMicroelectronics, Grenoble, France


M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Transition Fault Testing for Offline Adaptive Voltage Scaling (to appear: October 2017), International Test Conference (ITC 2017), 31 October - 2 November 2017, Fort Worth, USA [Conference Proceedings]
M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Using Transition Fault Test Patterns for Cost Effective Offline Performance Estimation (April 2017), 12th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS 2017), 4-6 April 2017, Palma de Mallorca, Spain [Conference Paper]
M. Zandrahimi, A. Castillejo, P. Debaud, Z. Al-Ars, Industrial Approaches for Performance Evaluation Using On-Chip Monitors 1561_industrial_approaches_for_performance_evaluation_using_onc.pdf (December 2016), 11th IEEE International Design & Test Symposium (IDT 2016), 18-20 December 2016, Hammamet, Tunisia [Conference Paper]
M. Zandrahimi, Z. Al-Ars, P. Debaud, A. Castillejo, Challenges of Using On-Chip Performance Monitors for Process and Environmental Variation Compensation (March 2016), Design, Automation and Test in Europe (DATE 2016), 14-18 March 2016, Dresden, Germany [Conference Proceedings]