A. Castillejo

NameA. Castillejo
First NameArmand
E-mailarmand.castillejo@st.com
Author TypeExternal
AffiliationSTMicroelectronics, Grenoble, France

Publications

M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing (September 2018), 16th IEEE East-West Design & Test Symposium (EWDTS 2018), 14-17 September 2018, Kazan, Russia [Conference Paper]
M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling 1685_industrial_evaluation_of_transition_fault_testing_for_cost.pdf (March 2018), Design, Automation and Test in Europe (DATE 2018), 19-23 March 2018, Dresden, Germany [Conference Paper]
M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, An Industrial Case Study of Low Cost Adaptive Voltage Scaling Using Delay Test Patterns 1684_an_industrial_case_study_of_low_cost_adaptive_voltage_scali.pdf (March 2018), Design, Automation and Test in Europe (DATE 2018), 19-23 March 2018, Dresden, Germany [Conference Paper]
M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Transition Fault Testing for Offline Adaptive Voltage Scaling 1683_transition_fault_testing_for_offline_adaptive_voltage_scali.pdf (October 2017), International Test Conference (ITC 2017), 31 October - 2 November 2017, Fort Worth, USA [Conference Paper]
M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Using Transition Fault Test Patterns for Cost Effective Offline Performance Estimation 1620_using_transition_fault_test_patterns_for_cost_effective_off.pdf (April 2017), 12th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS 2017), 4-6 April 2017, Palma de Mallorca, Spain [Conference Paper]
M. Zandrahimi, A. Castillejo, P. Debaud, Z. Al-Ars, Industrial Approaches for Performance Evaluation Using On-Chip Monitors 1561_industrial_approaches_for_performance_evaluation_using_onc.pdf (December 2016), 11th IEEE International Design & Test Symposium (IDT 2016), 18-20 December 2016, Hammamet, Tunisia [Conference Paper]
M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Challenges of Using On-Chip Performance Monitors for Process and Environmental Variation Compensation 1682_challenges_of_using_onchip_performance_monitors_for_proces.pdf (March 2016), Design, Automation and Test in Europe (DATE 2016), 14-18 March 2016, Dresden, Germany [Conference Paper]