M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing (September 2018), 16th IEEE East-West Design & Test Symposium (EWDTS 2018), 14-17 September 2018, Kazan, Russia [Conference Paper]

M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling (March 2018), Design, Automation and Test in Europe (DATE 2018), 19-23 March 2018, Dresden, Germany [Conference Paper]

M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, An Industrial Case Study of Low Cost Adaptive Voltage Scaling Using Delay Test Patterns (March 2018), Design, Automation and Test in Europe (DATE 2018), 19-23 March 2018, Dresden, Germany [Conference Paper]

M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Transition Fault Testing for Offline Adaptive Voltage Scaling (October 2017), International Test Conference (ITC 2017), 31 October - 2 November 2017, Fort Worth, USA [Conference Paper]

M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Using Transition Fault Test Patterns for Cost Effective Offline Performance Estimation (April 2017), 12th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS 2017), 4-6 April 2017, Palma de Mallorca, Spain [Conference Paper]

M. Zandrahimi, A. Castillejo, P. Debaud, Z. Al-Ars, Industrial Approaches for Performance Evaluation Using On-Chip Monitors (December 2016), 11th IEEE International Design & Test Symposium (IDT 2016), 18-20 December 2016, Hammamet, Tunisia [Conference Paper]

M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Challenges of Using On-Chip Performance Monitors for Process and Environmental Variation Compensation (March 2016), Design, Automation and Test in Europe (DATE 2016), 14-18 March 2016, Dresden, Germany [Conference Paper]