A. Singh
Name | A. Singh |
---|---|
First Name | Adit |
Author Type | External |
Affiliation | Auburn University |
Publications
D.H.P. Kraak, M. Taouil, S. Hamdioui, M. Wasif, F. Catthoor, A. Chatterjee, A. Singh, H.J. Wunderlich, N. Karimi,
Device Aging: A Reliability and Security Concern
(July 2018),
23rd IEEE European Test Symposium (ETS 2018), 28 May - 1 June 2018, Bremen, Germany
[Conference Paper]