D.H.P. Kraak, M. Taouil, S. Hamdioui, M. Wasif, F. Catthoor, A. Chatterjee, A. Singh, H.J. Wunderlich, N. Karimi, Device Aging: A Reliability and Security Concern (July 2018), 23rd IEEE European Test Symposium (ETS 2018), 28 May - 1 June 2018, Bremen, Germany [Conference Paper]

I.O. Agbo, M. Taouil, D.H.P. Kraak, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, W Dehaene, Impact and Mitigation of SRAM Read Path Aging (June 2018), Microelectronics Reliability, volume 87 [Journal Paper]

D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, Degradation analysis of high performance 14nm FinFET SRAM (March 2018), Design, Automation and Test in Europe (DATE 2018), 19-23 March 2018, Dresden, Germany [Conference Paper]

D.H.P. Kraak, M. Taouil, I.O. Agbo, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads (October 2017), IEEE Transactions On Very Large Scale Integration (VLSI) Systems (TVLSI) [Journal Paper]

I.O. Agbo, M. Taouil, D.H.P. Kraak, S. Hamdioui, H. Kukner, P Weckx, P. Raghavan, F. Catthoor, Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier (April 2017), IEEE Transactions On Very Large Scale Integration (VLSI) Systems (TVLSI), volume 25, issue 4 [Journal Paper]

D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, W Dehaene, Mitigation of sense amplifier degradation using input switching (March 2017), Design, Automation and Test in Europe (DATE 2017), 27-31 March 2017, Lausanne, Switzerland [Conference Paper]

D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, W Dehaene, On Mitigating Sense Amplifier Offset Voltage Degradation (November 2016), First IEEE International Workshop on Automotive Reliability & Test (ART Workshop 2016), 17-18 November 2016, Fort Worth, USA [Conference Paper]

D.H.P. Kraak, Experimental and Industrial Evaluation of Variability Resilient Schemes (January 2016), [Msc Thesis]