D.H.P. Kraak, M. Taouil, S. Hamdioui, M. Wasif, F. Catthoor, A. Chatterjee, A. Singh, H.J. Wunderlich, N. Karimi, Device Aging: A Reliability and Security Concern (July 2018), 23rd IEEE European Test Symposium (ETS 2018), 28 May - 1 June 2018, Bremen, Germany [Conference Paper]

M. Wasif, A Compact, High Precision Position Sensing Embedded System for Fast Steering Mirror (February 2015), [Msc Thesis]