C.I.M. Beenakker

NameC.I.M. Beenakker
First NameKees
Author TypeExternal
AffiliationTU Delft


M. Taouil, S. Hamdioui, C.I.M. Beenakker, E.J. Marinissen, Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost 92_test_impact_on_the_overall_dietowafer_3d_stacked_ic_cost.pdf (December 2011), Journal of Electronic Testing: Theory and Applications (JETTA), volume 28, issue 1 [Journal Paper]
W. Fang, A.J. van Genderen, R. Ishihara, R. Vikas, N. Karaki, Y. Hiroschima, S. Inoue, T. Shimoda, J.W. Metselaar, C.I.M. Beenakker, Automated Digital Circuits Design based on Single-Grain Si TFTs Fabricated Through the micro-Czochralski (Grain Filter) Process 728_automated_digital_circuits_design_based_on_singlegrain_si_t.pdf (July 2006), 13th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD 2006), 5-7 July 2006, Tokyo, Japan [Conference Paper]