C.I.M. Beenakker
Name | C.I.M. Beenakker |
---|---|
First Name | Kees |
Author Type | External |
Affiliation | TU Delft |
Publications
M. Taouil, S. Hamdioui, C.I.M. Beenakker, E.J. Marinissen,
Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost
(December 2011),
Journal of Electronic Testing: Theory and Applications (JETTA), volume 28, issue 1
[Journal Paper]
W. Fang, A.J. van Genderen, R. Ishihara, R. Vikas, N. Karaki, Y. Hiroschima, S. Inoue, T. Shimoda, J.W. Metselaar, C.I.M. Beenakker,
Automated Digital Circuits Design based on Single-Grain Si TFTs Fabricated Through the micro-Czochralski (Grain Filter) Process
(July 2006),
13th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD 2006), 5-7 July 2006, Tokyo, Japan
[Conference Paper]