Computer Engineering Publications Database (2000-2018) B Kaczer
| Name | B Kaczer |
|---|---|
| First Name | Ben |
| Author Type | External |
| Affiliation | imec vzw., Kapeldreef 75, B-3001, Leuven, Belgium |
Publications
M.S. Khan, I.O. Agbo, S. Hamdioui, H. Kukner, B Kaczer, P. Raghavan, F. Catthoor,
Bias Temperature Instability analysis of FinFET based SRAM cells
(March 2014),
Design, Automation & Test in Europe (DATE 2014), 24-28 March 2014, Dresden, Germany
[Conference Proceedings]
(March 2014),
Design, Automation & Test in Europe (DATE 2014), 24-28 March 2014, Dresden, Germany
[Conference Proceedings]