I.O. Agbo
Name | I.O. Agbo |
---|---|
First Name | Innocent |
Author Type | Msc Student |
Affiliation | TU Delft |
Publications
I.O. Agbo, M. Taouil, D.H.P. Kraak, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, W Dehaene,
Impact and Mitigation of SRAM Read Path Aging
(June 2018),
Microelectronics Reliability, volume 87
[Journal Paper]
D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor,
Degradation analysis of high performance 14nm FinFET SRAM
(March 2018),
Design, Automation and Test in Europe (DATE 2018), 19-23 March 2018, Dresden, Germany
[Conference Paper]
D.H.P. Kraak, M. Taouil, I.O. Agbo, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor,
Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads
(October 2017),
IEEE Transactions On Very Large Scale Integration (VLSI) Systems (TVLSI)
[Journal Paper]
I.O. Agbo, M. Taouil, D.H.P. Kraak, S. Hamdioui, H. Kukner, P Weckx, P. Raghavan, F. Catthoor,
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier
(April 2017),
IEEE Transactions On Very Large Scale Integration (VLSI) Systems (TVLSI), volume 25, issue 4
[Journal Paper]
D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, W Dehaene,
Mitigation of sense amplifier degradation using input switching
(March 2017),
Design, Automation and Test in Europe (DATE 2017), 27-31 March 2017, Lausanne, Switzerland
[Conference Paper]
D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, W Dehaene,
On Mitigating Sense Amplifier Offset Voltage Degradation
(November 2016),
First IEEE International Workshop on Automotive Reliability & Test (ART Workshop 2016), 17-18 November 2016, Fort Worth, USA
[Conference Paper]
I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, P. Raghavan, F. Catthoor, W Dehaene,
Quantification of Sense Amplifier Offset Voltage Degradation due to Zero- and Run-time Variability
(July 2016),
IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2016), 11-13 July 2016, Pittsburgh, U.S.A.
, Best Paper Award
[Conference Proceedings]
I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor, W Dehaene,
Read Path Degradation Analysis in SRAM
(May 2016),
IEEE European Test Symposium (ETS 2016), 24-27 May 2016, Amsterdam, The Netherlands
[Conference Proceedings]
I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, P. Raghavan, F. Catthoor,
Comparative BTI Analysis for Various Sense Amplifier Designs
(April 2016),
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2016), 20-22 April 2016, Košice, Slovakia
[Conference Proceedings]
I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, F. Catthoor,
BTI Analysis of SRAM Write Driver
(December 2015),
10th IEEE International Design & Test Symposium (IDT 2015), 14-16 December 2015, Dead Sea, Jordan
[Conference Proceedings]
I.O. Agbo, M. Taouil, S. Hamdioui, P Weckx, S. Cosemans, P. Raghavan, F. Catthoor, W Dehaene,
Comparative BTI Impact for SRAM Cell and Sense Amplifier Designs
(November 2015),
MEDIAN Finale - Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN 2015), 10-11 November 2015, Tallinn, Estonia
[Conference Proceedings]
I.O. Agbo, M. Taouil, S. Hamdioui, S. Cosemans, P Weckx, P. Raghavan, F. Catthoor,
Comparative Analysis of R-D and Atomistic Trap-Based BTI models on SRAM Sense Amplifier
(April 2015),
Design and Technology of Integrated Systems in the Nanoscale Era (DTIS 2015), 21-23 April 2015, Naples, Italy
, Best Paper Award
[Conference Proceedings]
I.O. Agbo, M. Taouil, S. Hamdioui, H. Kukner, P Weckx, P. Raghavan, F. Catthoor,
Integral Impact of BTI and Voltage Temperature Variation on SRAM Sense Amplifier
(April 2015),
IEEE VLSI Test Symposium (VTS 2015), 27-29 April 2015, Napa, USA
[Conference Proceedings]
I.O. Agbo, M. Taouil, S. Hamdioui, H. Kukner, P Weckx, P. Raghavan, F. Catthoor,
BTI Analysis for High Performance and Low power SRAM Sense Amplifier
(March 2015),
4th Workshop On Manufacturable and Dependable Multicore Architectures (MEDIAN 2015), 13 March 2015, Grenoble, France
[Conference Paper]
I.O. Agbo, M. Taouil, S. Hamdioui, H. Kukner, P. Raghavan, F. Catthoor,
Impact of BTI on SRAM Sense Amplifier in the Presence of Temperature and Process Variation
(September 2014),
Joint MEDIAN–TRUDEVICE Open Forum, 30 September 2014, Amsterdam, The Netherlands
[Conference Proceedings]
M.S. Khan, I.O. Agbo, S. Hamdioui, H. Kukner, B Kaczer, P. Raghavan, F. Catthoor,
Bias Temperature Instability analysis of FinFET based SRAM cells
(March 2014),
Design, Automation & Test in Europe (DATE 2014), 24-28 March 2014, Dresden, Germany
[Conference Proceedings]
I.O. Agbo, M.S. Khan, S. Hamdioui,
BTI Impact on SRAM Sense Amplifier
(December 2013),
8th IEEE International Design and Test Symposium (IDT 2013), 16-18 December 2013, Marrakesh, Morocco
[Conference Paper]
I.O. Agbo, S. Safiruddin, S.D. Cotofana,
Implementable Building Blocks for Fluctuation Based Calculation in Single Electron Tunneling Technology
(July 2009),
9th IEEE Conference on Nanotechnology (IEEE-NANO 2009), 26-30 July 2009, Genoa, Italy
[Conference Paper]