M.S. Khan, I.O. Agbo, S. Hamdioui, H. Kukner, B Kaczer, P. Raghavan, F. Catthoor, Bias Temperature Instability analysis of FinFET based SRAM cells (March 2014), Design, Automation & Test in Europe (DATE 2014), 24-28 March 2014, Dresden, Germany [Conference Proceedings]

H. Kukner, M.S. Khan, S. Hamdioui, P. Raghavan, F. Catthoor, Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates (March 2014), IEEE Transactions on Reliability (TR), volume 14, issue 1 [Journal Paper]

I.O. Agbo, M.S. Khan, S. Hamdioui, BTI Impact on SRAM Sense Amplifier (December 2013), 8th IEEE International Design and Test Symposium (IDT 2013), 16-18 December 2013, Marrakesh, Morocco [Conference Paper]

M.S. Khan, Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits (September 2013), [Phd Thesis]

M.S. Khan, Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-Scaled Circuits (September 2013), [Phd Thesis]

M.S. Khan, S. Hamdioui, H. Kukner, P. Raghavan, F. Catthoor, Bias temperature instability analysis in SRAM decoder (May 2013), 18th IEEE European Test Symposium (ETS 2013), 27-31 May 2013, Avignon, France [Conference Paper]

M.S. Khan, S. Hamdioui, Variability and Reliability Analyses in SRAM Decoder (January 2013), 4th Workshop on Design for Reliability (DFR 2012), 23-25 January 2012, Paris, France [Conference Paper]

M.S. Khan, S. Hamdioui, M. Taouil, H. Kukner, P. Raghavan, F. Catthoor, Impact of Partial Resistive Defects and Bias Temperature Instability on SRAM Decoder Reliablity (December 2012), International Design & Test Symposium (IDT 2012), 15-17 December 2012, Doha, Qatar [Conference Proceedings]

M.S. Khan, S. Hamdioui, H. Kukner, P. Raghavan, F. Catthoor, Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis (October 2012), IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2012), 3-5 October 2012, Austin, USA [Conference Paper]

M.S. Khan, S. Hamdioui, Analyzing Combined Impacts of Parameter Variations and BTI in Nano-scale Logical Gates (June 2012), 1st Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN 2012), 1 June 2012, Annecy, France [Conference Paper]

M.S. Khan, S. Hamdioui, H. Kukner, F. Catthoor, P. Raghavan, BTI Impacts on Logical Gates in Nano-scale CMOS Technology (April 2012), 15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2012), 18-20 April 2012, Tallinn, Estonia [Conference Paper]

M.S. Khan, S. Hamdioui, F. Catthoor, Comparative BTI Analysis in Nano-scale Circuits Lifetime (January 2012), 4th Workshop on Design for Reliability (DFR 2012), 23-25 January 2012, Paris, France [Conference Paper]

M.S. Khan, S. Hamdioui, ReverseAge: an Online NBTI Combating Technique Using Time Borrowing (December 2011), IEEE 6th International Design and Test Workshop (IDT 2011), 11-14 December 2011, Beirut, Lebanon [Conference Paper]

M.S. Khan, S. Hamdioui, N.Z.B. Haron, F. Catthoor, NBTI Monitoring and Design for Reliability in Nanoscale Circuits (October 2011), IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2011), 3-5 October 2011, Vancouver, Canada [Conference Paper]

M.S. Khan, S. Hamdioui, Modeling and Mitigating NBTI in Nanoscale Circuits (July 2011), 17th IEEE International On-Line Testing Symposium (IOLTS), 13-15 July 2011, Athens, Greece [Conference Paper]

M.S. Khan, S. Hamdioui, NBTI-Aware Nanoscaled Circuit Delay Assessment and Mitigation (January 2011), 3rd HiPEAC Workshop on Design for Reliability (DFR 2011), 23 January 2011, Heraklion, Greece [Conference Paper]

M.S. Khan, S. Hamdioui, Temperature Dependence of NBTI Induced Delay (July 2010), 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July 2010, Corfu, Greece [Conference Paper]

M.S. Khan, S. Hamdioui, NBTI Modeling in the Framework of Temperature Variation (March 2010), Design, Automation and Test in Europe (DATE 2010), 8-12 March 2010, Dresden, Germany [Conference Paper]

M.S. Khan, S. Hamdioui, Trends and challenges of SRAM reliability in the nano-scale era (March 2010), 5th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS 2010), 23-25 March 2010, Hammamet, Tunisia [Conference Paper]

M.S. Khan, S. Hamdioui, Temperature Impact on NBTI Modeling in the Framework of Technology Scaling (January 2010), 2nd HiPEAC Workshop on Design for Reliability (DFR 2010), 24 January 2010, Pisa, Italy [Conference Paper]

M.S. Khan, S. Hamdioui, N.Z.B. Haron, CMOS scaling impacts on Reliability, What do we understand? (November 2008), 19th Annual Workshop on Circuits, Systems and Signal Processing (ProRISC 2008), 27-28 November 2008, Veldhoven, The Netherlands [Conference Paper]