G. Mueller

NameG. Mueller
First NameGeorg
Author TypeExternal


Z. Al-Ars, S. Hamdioui, A.J. van de Goor, G. Mueller, Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs 545_defect_oriented_testing_of_the_strap_problem_under_process_v.pdf (October 2008), IEEE International Test Conference (ITC 2008), 26-31 October 2008, Santa Clara, USA [Conference Paper]
Z. Al-Ars, S. Hamdioui, G. Mueller, J. Vollrath, Bitline-Coupled Precharge Faults and Their Detection in Memory Devices 748_bitlinecoupled_precharge_faults_and_their_detection_in_memo.pdf (May 2006), 11th IEE European Test Symposium (ETS 2006), 21-24 May 2006, Southampton, UK [Conference Paper]
Z. Al-Ars, S. Hamdioui, G. Mueller, A.J. van de Goor, Framework for Fault Analysis and Test Generation in DRAMs 857_framework_for_fault_analysis_and_test_generation_in_drams.pdf (March 2005), Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany [Conference Paper]