G. Mueller
Name | G. Mueller |
---|---|
First Name | Georg |
Author Type | External |
Affiliation | Infineon |
Publications
Z. Al-Ars, S. Hamdioui, A.J. van de Goor, G. Mueller,
Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs
(October 2008),
IEEE International Test Conference (ITC 2008), 26-31 October 2008, Santa Clara, USA
[Conference Paper]
![545_defect_oriented_testing_of_the_strap_problem_under_process_v.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, G. Mueller, J. Vollrath,
Bitline-Coupled Precharge Faults and Their Detection in Memory Devices
(May 2006),
11th IEE European Test Symposium (ETS 2006), 21-24 May 2006, Southampton, UK
[Conference Paper]
![748_bitlinecoupled_precharge_faults_and_their_detection_in_memo.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, G. Mueller, A.J. van de Goor,
Framework for Fault Analysis and Test Generation in DRAMs
(March 2005),
Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany
[Conference Paper]
![857_framework_for_fault_analysis_and_test_generation_in_drams.pdf](/images/pdf-a.png)