Computer Engineering Publications Database (2000-2018) D. Eastwick
| Name | D. Eastwick |
|---|---|
| First Name | David |
| Author Type | External |
| Affiliation | Intel, USA |
Publications
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers,
Detecting unique faults in multi-port SRAMs
(November 2001),
10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan
[Conference Paper]
(November 2001),
10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan
[Conference Paper]
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers,
Realistic fault models and test procedure for multi-port SRAMs
(August 2001),
9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, USA
[Conference Paper]
(August 2001),
9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, USA
[Conference Paper]
S. Hamdioui, A.J. van de Goor, M. Rodgers, D. Eastwick,
March tests for realistic faults in two-port memories
(August 2000),
8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, USA
[Conference Paper]
(August 2000),
8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, USA
[Conference Paper]