D. Eastwick

NameD. Eastwick
First NameDavid
E-mail
Author TypeExternal
AffiliationIntel, USA

Publications

S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers, Detecting unique faults in multi-port SRAMs 1217_detecting_unique_faults_in_multiport_srams.pdf (November 2001), 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan [Conference Paper]
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers, Realistic fault models and test procedure for multi-port SRAMs 1179_realistic_fault_models_and_test_procedure_for_multiport_sr.pdf (August 2001), 9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, USA [Conference Paper]
S. Hamdioui, A.J. van de Goor, M. Rodgers, D. Eastwick, March tests for realistic faults in two-port memories 1249_march_tests_for_realistic_faults_in_twoport_memories.pdf (August 2000), 8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, USA [Conference Paper]