M. Rodgers

NameM. Rodgers
First Name
E-mail
Author TypeExternal
Affiliation

Publications

S. Hamdioui, A.J. van de Goor, J.D. Reyes, M. Rodgers, Memory Test Experiment: Industrial Results and Data 807_memory_test_experiment_industrial_results_and_data.pdf (January 2006), IEE Proceedings - Computers and Digital Techniques, volume 153, issue 1 [Journal Paper]
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers, Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results 931_linked_faults_in_random_access_memories_concept_fault_mode.pdf (May 2004), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 23, issue 5 [Journal Paper]
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers, March SL: A Test For All Static Linked Memory Faults 1065_march_sl_a_test_for_all_static_linked_memory_faults.pdf (November 2003), 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China [Conference Paper]
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers, Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests 1039_dynamic_faults_in_randomaccessmemories_concept_fault_mo.pdf (April 2003), Journal of Electronic Testing: Theory and Applications (JETTA), volume 19, issue 2 [Journal Paper]
S. Hamdioui, A.J. van de Goor, M. Rodgers, Detecting intra-word faults in word-oriented memories 1040_detecting_intraword_faults_in_wordoriented_memories.pdf (April 2003), 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, USA [Conference Paper]
S. Hamdioui, A.J. van de Goor, M. Rodgers, March SS: A test for all static simple RAM faults 1107_march_ss_a_test_for_all_static_simple_ram_faults.pdf (July 2002), 10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France [Conference Paper]
S. Hamdioui, A.J. van de Goor, M. Rodgers, DPM Reduction On Dual Port Caches 1116_dpm_reduction_on_dual_port_caches.pdf (May 2002), 7th IEEE European Test Workshop (ETW 2002), 26-29 May 2002, Corfu, Greece [Conference Paper]
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers, Detecting unique faults in multi-port SRAMs 1217_detecting_unique_faults_in_multiport_srams.pdf (November 2001), 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan [Conference Paper]
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers, Realistic fault models and test procedure for multi-port SRAMs 1179_realistic_fault_models_and_test_procedure_for_multiport_sr.pdf (August 2001), 9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, USA [Conference Paper]
S. Hamdioui, A.J. van de Goor, M. Rodgers, D. Eastwick, March tests for realistic faults in two-port memories 1249_march_tests_for_realistic_faults_in_twoport_memories.pdf (August 2000), 8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, USA [Conference Paper]