M. Rodgers
Name | M. Rodgers |
---|---|
First Name | |
Author Type | External |
Affiliation |
Publications
S. Hamdioui, A.J. van de Goor, J.D. Reyes, M. Rodgers,
Memory Test Experiment: Industrial Results and Data
(January 2006),
IEE Proceedings - Computers and Digital Techniques, volume 153, issue 1
[Journal Paper]
![807_memory_test_experiment_industrial_results_and_data.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers,
Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results
(May 2004),
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 23, issue 5
[Journal Paper]
![931_linked_faults_in_random_access_memories_concept_fault_mode.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers,
March SL: A Test For All Static Linked Memory Faults
(November 2003),
12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China
[Conference Paper]
![1065_march_sl_a_test_for_all_static_linked_memory_faults.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, M. Rodgers,
Detecting intra-word faults in word-oriented memories
(April 2003),
21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, USA
[Conference Paper]
![1040_detecting_intraword_faults_in_wordoriented_memories.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers,
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests
(April 2003),
Journal of Electronic Testing: Theory and Applications (JETTA), volume 19, issue 2
[Journal Paper]
![1039_dynamic_faults_in_randomaccessmemories_concept_fault_mo.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, M. Rodgers,
March SS: A test for all static simple RAM faults
(July 2002),
10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France
[Conference Paper]
![1107_march_ss_a_test_for_all_static_simple_ram_faults.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, M. Rodgers,
DPM Reduction On Dual Port Caches
(May 2002),
7th IEEE European Test Workshop (ETW 2002), 26-29 May 2002, Corfu, Greece
[Conference Paper]
![1116_dpm_reduction_on_dual_port_caches.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers,
Detecting unique faults in multi-port SRAMs
(November 2001),
10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan
[Conference Paper]
![1217_detecting_unique_faults_in_multiport_srams.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers,
Realistic fault models and test procedure for multi-port SRAMs
(August 2001),
9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, USA
[Conference Paper]
![1179_realistic_fault_models_and_test_procedure_for_multiport_sr.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, M. Rodgers, D. Eastwick,
March tests for realistic faults in two-port memories
(August 2000),
8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, USA
[Conference Paper]
![1249_march_tests_for_realistic_faults_in_twoport_memories.pdf](/images/pdf-a.png)