M. Escudero Martinez, A. Rubio, P. Pouyan, Reliability issues in RRAM ternary memories affected by variability and aging mechanisms (July 2017), 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), 3-5 July 2017, Thessaloniki, Greece [Conference Proceedings]

P. Pouyan, E. Amat, A. Rubio, S. Hamdioui, Resistive Random Access Memory Variability and Its Mitigation Schemes (February 2017), Journal of Low Power Electronics (JOLPE), volume 13, issue 1 [Journal Paper]

M. Escudero Martinez, E. Amat, A. Rubio, P. Pouyan, An experience with Chalcogenide memristors, and implications on memory and computer applications (November 2016), Conference on Design of Circuits and Integrated Systems (DCIS 2016), 23-25 November 2016, Granada, Spain [Conference Proceedings]

P. Pouyan, E. Amat, S. Hamdioui, A. Rubio, RRAM Variability and Its Mitigation Schemes (September 2016), PATMOS & VARI 2016 (PATMOS & VARI 2016), 21-23 September 2016, Bremen, Germany , Best Paper Award [Conference Proceedings]

N. Aymerich, S.D. Cotofana, A. Rubio, Controlled Degradation Stochastic Resonance in Adaptive Averaging Cell based Architectures (November 2013), IEEE Transactions on Nanotechnology (TNANO), volume 12, issue 6 [Journal Paper]

N. Aymerich, S.D. Cotofana, A. Rubio, Degradation Stochastic Resonance (DSR) in AD-AVG Architectures (August 2012), 12th IEEE Conference on Nanotechnology (IEEE NANO 2012), 20-23 August 2012, Birmingham, UK , Best PhD Student Paper Award [Conference Paper]

N. Aymerich, S.D. Cotofana, A. Rubio, Adaptive Fault-Tolerant Architecture for Unreliable Technologies with Heterogenous Variability (July 2012), IEEE Transactions on Nanotechnology (TNANO), volume 11, issue 4 [Journal Paper]

D. Andrade, A. Rubio, A. Calomarde, S.D. Cotofana, Analysis of delay mismatching of digital circuits caused by common environmental fluctuations (May 2011), IEEE International Symposium on Circuits and Systems (ISCAS 2011), 15-18 May, 2011, Rio de Janeiro, Brazil [Conference Paper]

C.G. Almudever, A. Rubio, Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario (April 2011), 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2011), 13-14 April 2011, Cottbus, Germany [Conference Proceedings]

F. Martorell, S.D. Cotofana, A. Rubio, An Analysis of Internal Parameter Variations Effects on Nanoscaled Gates (January 2008), IEEE Transactions on Nanotechnology (TNANO), volume 7, issue 1 [Journal Paper]

F. Martorell, S.D. Cotofana, A. Rubio, Manufacturability Issues of Redundant Nanogates (October 2007), International Semiconductor Conference (CAS 2007), 15-17 October 2007, Sinaia, Romania [Conference Paper]

F. Martorell, S.D. Cotofana, A. Rubio, Fault Tolerant Structures for Nanoscale Gates (August 2007), 7th IEEE International Conference on Nanotechnology (IEEE-NANO 2007), 2-5 August 2007, Hong Kong, China [Conference Paper]

S.D. Cotofana, A. Schmid, Y. Leblebici, A. Ionescu, O. Soffke, P. Zipf, M. Glesner, A. Rubio, CONAN - A Design Exploration Framework for Reliable Nano-Electronics Architectures (July 2005), 16th IEEE International Conference on Application-Specific Systems, Architectures, and Processors (ASAP 2005), 23-25 July 2005, Samos, Greece [Conference Paper]