A. Rubio

NameA. Rubio
First Name
E-mail
Author TypeExternal
Affiliation

Publications

P. Pouyan, S. Hamdioui, A. Rubio, RRAM Variability and Its Mitigation Schemes 1569_rram_variability_and_its_mitigation_schemes.pdf (September 2016), PATMOS & VARI 2016 (PATMOS & VARI 2016), 21-23 September 2016, Bremen, Germany , Best Paper Award [Conference Proceedings]
N. Aymerich, S.D. Cotofana, A. Rubio, Controlled Degradation Stochastic Resonance in Adaptive Averaging Cell based Architectures 1364_controlled_degradation_stochastic_resonance_in_adaptive_ave.pdf (November 2013), IEEE Transactions on Nanotechnology (TNANO), volume 12, issue 6 [Journal Paper]
N. Aymerich, S.D. Cotofana, A. Rubio, Degradation Stochastic Resonance (DSR) in AD-AVG Architectures 1327_degradation_stochastic_resonance_dsr_in_adavg_architectu.pdf (August 2012), 12th IEEE Conference on Nanotechnology (IEEE NANO 2012), 20-23 August 2012, Birmingham, UK , Best PhD Student Paper Award [Conference Paper]
N. Aymerich, S.D. Cotofana, A. Rubio, Adaptive Fault-Tolerant Architecture for Unreliable Technologies with Heterogenous Variability 1326_adaptive_faulttolerant_architecture_for_unreliable_technol.pdf (July 2012), IEEE Transactions on Nanotechnology (TNANO), volume 11, issue 4 [Journal Paper]
D. Andrade, A. Rubio, A. Calomarde, S.D. Cotofana, Analysis of delay mismatching of digital circuits caused by common environmental fluctuations (May 2011), IEEE International Symposium on Circuits and Systems (ISCAS 2011), 15-18 May, 2011, Rio de Janeiro, Brazil [Conference Paper]
C.G. Almudever, A. Rubio, Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario (April 2011), 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2011), 13-14 April 2011, Cottbus, Germany [Conference Proceedings]
F. Martorell, S.D. Cotofana, A. Rubio, An Analysis of Internal Parameter Variations Effects on Nanoscaled Gates 556_an_analysis_of_internal_parameter_variations_effects_on_nano.pdf (January 2008), IEEE Transactions on Nanotechnology (TNANO), volume 7, issue 1 [Journal Paper]
F. Martorell, S.D. Cotofana, A. Rubio, Manufacturability Issues of Redundant Nanogates 694_manufacturability_issues_of_redundant_nanogates.pdf (October 2007), International Semiconductor Conference (CAS 2007), 15-17 October 2007, Sinaia, Romania [Conference Paper]
F. Martorell, S.D. Cotofana, A. Rubio, Fault Tolerant Structures for Nanoscale Gates 579_fault_tolerant_structures_for_nanoscale_gates.pdf (August 2007), 7th IEEE International Conference on Nanotechnology (IEEE-NANO 2007), 2-5 August 2007, Hong Kong, China [Conference Paper]
S.D. Cotofana, A. Schmid, Y. Leblebici, A. Ionescu, O. Soffke, P. Zipf, M. Glesner, A. Rubio, CONAN - A Design Exploration Framework for Reliable Nano-Electronics Architectures 829_conan__a_design_exploration_framework_for_reliable_nanoele.pdf (July 2005), 16th IEEE International Conference on Application-Specific Systems, Architectures, and Processors (ASAP 2005), 23-25 July 2005, Samos, Greece [Conference Paper]