L. Fang

NameL. Fang
First NameLiang
Author TypeExternal
AffiliationNational University of Defense Technology, China


Y. Wang, S.D. Cotofana, L. Fang, Lifetime Reliability Assessment with Aging Information from Low-Level Sensors 1591_lifetime_reliability_assessment_with_aging_information_from.pdf (May 2013), Great Lakes Symposium on VLSI (GLSVLSI 2013 ), 2-3 May 2013, Paris, France [Conference Paper]
Y. Wang, M. Enachescu, S.D. Cotofana, L. Fang, Variation tolerant on-chip degradation sensors for dynamic reliability management systems 1310_variation_tolerant_onchip_degradation_sensors_for_dynamic.pdf (September 2012), Microelectronics Reliability, volume 52, issue 9-10 [Journal Paper]
Y. Wang, S.D. Cotofana, L. Fang, Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices 1294_statistical_reliability_analysis_of_nbti_impact_on_finfet_s.pdf (July 2012), IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2012), 4-6 July 2012, Amsterdam, The Netherlands [Conference Paper]