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L. Fang

NameL. Fang
First NameLiang
E-mail
Author TypeExternal
AffiliationNational University of Defense Technology, China

Publications

Y. Wang, S.D. Cotofana, L. Fang, Analysis of the Impact of Spatial and Temporal Variation on the Stability of SRAM Arrays and Mitigation Technique Using Independent-Gate Devices 1566_analysis_of_the_impact_of_spatial_and_temporal_variation_on.pdf (June 2014), Journal of Parallel and Distributed Computing, volume 74, issue 6 [Journal Paper]
Y. Wang, S.D. Cotofana, L. Fang, Lifetime Reliability Assessment with Aging Information from Low-Level Sensors 1591_lifetime_reliability_assessment_with_aging_information_from.pdf (May 2013), Great Lakes Symposium on VLSI (GLSVLSI 2013 ), 2-3 May 2013, Paris, France [Conference Paper]
Y. Wang, M. Enachescu, S.D. Cotofana, L. Fang, Variation tolerant on-chip degradation sensors for dynamic reliability management systems 1310_variation_tolerant_onchip_degradation_sensors_for_dynamic.pdf (September 2012), Microelectronics Reliability, volume 52, issue 9-10 [Journal Paper]
Y. Wang, S.D. Cotofana, L. Fang, Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices 1294_statistical_reliability_analysis_of_nbti_impact_on_finfet_s.pdf (July 2012), IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2012), 4-6 July 2012, Amsterdam, The Netherlands [Conference Paper]