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J.D. Reyes

NameJ.D. Reyes
First NameJohn
E-mail
Author TypeExternal
AffiliationIntel, USA

Publications

S. Hamdioui, Z. Al-Ars, G.N. Gaydadjiev, J.D. Reyes, Comparison of Static and Dynamic Faults in 65nm Memory Technology 790_comparison_of_static_and_dynamic_faults_in_65nm_memory_techn.pdf (November 2006), 1st IEEE International Design and Test Workshop (IDT 2006), 19-20 November 2006, Dubai, UAE [Conference Paper]
S. Hamdioui, Z. Al-Ars, G.N. Gaydadjiev, J.D. Reyes, Investigation of Single-Cell Dynamic Faults in Deep-Submicron Memory Technologies 747_investigation_of_singlecell_dynamic_faults_in_deepsubmicro.pdf (May 2006), 11th IEE European Test Symposium (ETS 2006), 21-24 May 2006, Southampton, UK [Conference Paper]
S. Hamdioui, A.J. van de Goor, J.D. Reyes, M. Rodgers, Memory Test Experiment: Industrial Results and Data 807_memory_test_experiment_industrial_results_and_data.pdf (January 2006), IEE Proceedings - Computers and Digital Techniques, volume 153, issue 1 [Journal Paper]
S. Hamdioui, J.D. Reyes, New Data-Background Sequences and Their Industrial Evaluation for Word-Oriented Random-Access Memories 841_new_databackground_sequences_and_their_industrial_evaluatio.pdf (June 2005), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 24, issue 6 [Journal Paper]
S. Hamdioui, J.D. Reyes, Z. Al-Ars, Evaluation of Intra-Word Faults in Word-Oriented RAMs 966_evaluation_of_intraword_faults_in_wordoriented_rams.pdf (November 2004), 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan [Conference Paper]
S. Hamdioui, R. Wadsworth, J.D. Reyes, A.J. van de Goor, Memory Fault Modeling Trends: A Case Study 925_memory_fault_modeling_trends_a_case_study.pdf (June 2004), Journal of Electronic Testing: Theory and Applications (JETTA), volume 20, issue 3 [Journal Paper]
S. Hamdioui, R. Wadsworth, J.D. Reyes, A.J. van de Goor, Importance of Dynamic Faults for New SRAM Technologies 1035_importance_of_dynamic_faults_for_new_sram_technologies.pdf (May 2003), 8th IEEE European Test Workshop (ETW 2003), 25-28 May 2003, Maastricht, The Netherlands [Conference Paper]