R. Wadsworth
Name | R. Wadsworth |
---|---|
First Name | Rob |
Author Type | External |
Affiliation |
Publications
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, R. Wadsworth,
Impact of Stresses on the Fault Coverage of Memory Tests
(August 2005),
IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan
[Conference Paper]
![819_impact_of_stresses_on_the_fault_coverage_of_memory_tests.pdf](/images/pdf-a.png)
A.J. van de Goor, S. Hamdioui, R. Wadsworth,
Detecting Faults in Peripheral Circuits and an Evaluation of SRAM Tests
(October 2004),
International Test Conference (ITC 2004), 26-28 October 2004, Charlotte, USA
[Conference Paper]
![992_detecting_faults_in_peripheral_circuits_and_an_evaluation_of.pdf](/images/pdf-a.png)
S. Hamdioui, R. Wadsworth, J.D. Reyes, A.J. van de Goor,
Memory Fault Modeling Trends: A Case Study
(June 2004),
Journal of Electronic Testing: Theory and Applications (JETTA), volume 20, issue 3
[Journal Paper]
![925_memory_fault_modeling_trends_a_case_study.pdf](/images/pdf-a.png)
S. Hamdioui, R. Wadsworth, J.D. Reyes, A.J. van de Goor,
Importance of Dynamic Faults for New SRAM Technologies
(May 2003),
8th IEEE European Test Workshop (ETW 2003), 25-28 May 2003, Maastricht, The Netherlands
[Conference Paper]
![1035_importance_of_dynamic_faults_for_new_sram_technologies.pdf](/images/pdf-a.png)