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R. Wadsworth

NameR. Wadsworth
First NameRob
E-mail
Author TypeExternal
Affiliation

Publications

S. Hamdioui, Z. Al-Ars, A.J. van de Goor, R. Wadsworth, Impact of Stresses on the Fault Coverage of Memory Tests 819_impact_of_stresses_on_the_fault_coverage_of_memory_tests.pdf (August 2005), IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan [Conference Paper]
A.J. van de Goor, S. Hamdioui, R. Wadsworth, Detecting Faults in Peripheral Circuits and an Evaluation of SRAM Tests 992_detecting_faults_in_peripheral_circuits_and_an_evaluation_of.pdf (October 2004), International Test Conference (ITC 2004), 26-28 October 2004, Charlotte, USA [Conference Paper]
S. Hamdioui, R. Wadsworth, J.D. Reyes, A.J. van de Goor, Memory Fault Modeling Trends: A Case Study 925_memory_fault_modeling_trends_a_case_study.pdf (June 2004), Journal of Electronic Testing: Theory and Applications (JETTA), volume 20, issue 3 [Journal Paper]
S. Hamdioui, R. Wadsworth, J.D. Reyes, A.J. van de Goor, Importance of Dynamic Faults for New SRAM Technologies 1035_importance_of_dynamic_faults_for_new_sram_technologies.pdf (May 2003), 8th IEEE European Test Workshop (ETW 2003), 25-28 May 2003, Maastricht, The Netherlands [Conference Paper]