N. Cucu Laurenciu
Name | N. Cucu Laurenciu |
---|---|
First Name | Nicoleta |
N.CucuLaurenciu@tudelft.nl | |
Author Type | Phd Student |
Affiliation | TU Delft |
Publications
Y. Jiang, N. Cucu Laurenciu, S.D. Cotofana,
On Basic Boolean Function Graphene Nanoribbon Conductance Mapping
(December 2018),
IEEE Transactions on Circuits and Systems Part I: Regular Papers (TCAS I)
[Journal Paper]
N. Cucu Laurenciu, S.D. Cotofana,
On Effective Graphene based Computing
(October 2018),
41st International Semiconductor Conference (CAS 2018), 10-12 October 2018, Sinaia, Romania
[Conference Paper]
Y. Jiang, N. Cucu Laurenciu, S.D. Cotofana,
Complementary Arranged Graphene Nanoribbon-based Boolean Gates
(July 2018),
14th IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2018), 17-19 July 2018, Athens, Greece
[Conference Paper]
Y. Jiang, N. Cucu Laurenciu, S.D. Cotofana,
Non-Equilibrium Green Function-based Verilog-A Graphene Nanoribbon Model
(July 2018),
18th IEEE International Conference on Nanotechnology (IEEE NANO 2018), 23-26 July 2018, Cork, Ireland
[Conference Paper]
Y. Jiang, N. Cucu Laurenciu, S.D. Cotofana,
On Carving Basic Boolean Functions on Graphene Nanoribbons Conduction Maps
(May 2018),
IEEE International Symposium on Circuits and Systems (ISCAS), 27-30 May 2018, Florence
[Conference Paper]
N. Cucu Laurenciu, S.D. Cotofana,
Haar-based Interconnect Coding for Energy Effective Medium/Long Range Data Transport
(September 2017),
30th IEEE International System-on-Chip Conference (SOCC 2017), 5-8 September 2017, Munich, Germany
[Conference Paper]
N. Cucu Laurenciu, S.D. Cotofana,
Fast and Accurate Workload-Level Neural Network Based IC Energy Consumption Estimation
(June 2017),
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2017), 12-15 June 2017, Taormina, Italy
[Conference Paper]
N. Cucu Laurenciu, T. Gupta, V. Savin, S.D. Cotofana,
Error Correction Code Protected Data Processing Units
(July 2016),
IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2016), 18-20 July 2016, Beijing, China
[Conference Paper]
A. Amaricai, N. Cucu Laurenciu, O. Boncalo, J. Chen, S. Nimara, V. Savin, S.D. Cotofana,
Multi-Level Probabilistic Timing Error Reliability Analysis Using a Circuit Dependent Fault Map Generation
(November 2015),
XXX Conference on Design of Circuits and Integrated Systems (DCIS 2015), 25-27 November 2015, Estoril, Portugal
[Conference Paper]
A. Amaricai, V. Savin, O. Boncalo, N. Cucu Laurenciu, J. Chen, S.D. Cotofana,
Timing Error Analysis of Flooded LDPC Decoders
(November 2015),
IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS), 2-4 November 2015, Tel-Aviv, Israel
[Conference Paper]
N. Cucu Laurenciu, S.D. Cotofana,
Low Cost and Energy, Thermal Noise Driven, Probability Modulated Random Number Generator
(May 2015),
IEEE International Symposium on Circuits and Systems (ISCAS 2015), 24-27 May 2015, Lisbon, Portugal
[Conference Paper]
N. Cucu Laurenciu, S.D. Cotofana,
Probability Density Function Based Reliability Evaluation of Large-Scale ICs
(July 2014),
10th ACM/IEEE International Symposium on Nanoscale Architectures (NANOARCH 2014), 8-10 July 2014, Paris, France
[Conference Paper]
N. Cucu Laurenciu, S.D. Cotofana,
Critical Transistors Nexus Based Circuit-Level Aging Assessment and Prediction
(June 2014),
Journal of Parallel and Distributed Computing, volume 74, issue 6
[Journal Paper]
N. Cucu Laurenciu, S.D. Cotofana,
A Direct Measurement Scheme of Amalgamated Aging Effects with Novel On-Chip Sensor
(October 2013),
21st IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC 2013), 7-9 October 2013, Istanbul, Turkey
[Conference Paper]
N. Cucu Laurenciu, S.D. Cotofana,
A Nonlinear Degradation Path Dependent End-of-Life Estimation Framework from Noisy Observations
(September 2013),
Microelectronics Reliability, volume 53, issue 9-11
[Journal Paper]
N. Cucu Laurenciu, S.D. Cotofana,
Context Aware Slope Based Transistor-Level Aging Model
(October 2012),
Microelectronics Reliability, volume 52, issue 9-10
[Journal Paper]
N. Cucu Laurenciu, S.D. Cotofana,
A Markovian, Variation-Aware Circuit-Level Aging Model
(July 2012),
IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2012), 4-6 July 2012, Amsterdam, The Netherlands
[Conference Paper]